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Other articles related with "pulsed negative gate bias"：
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17303 |
Dong Zhang(张东), Chenfei Wu(武辰飞), Weizong Xu(徐尉宗), Fangfang Ren(任芳芳), Dong Zhou(周东), Peng Yu(于芃), Rong Zhang(张荣), Youdou Zheng(郑有炓), Hai Lu(陆海) |
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Investigation and active suppression of self-heating induced degradation in amorphous InGaZnO thin film transistors |
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Chin. Phys. B
2019 Vol.28 (1): 17303-017303
[Abstract]
(710)
[HTML 1 KB]
[PDF 528 KB]
(200)
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